10.1109/EDSSC.2014.7061107
Doi: 10.1109/EDSSC.2014.7061107
Title:
[IEEE 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Chengdu, China (2014.6.18-2014.6.20)] 2014 IEEE International Conference on Electron Devices and Solid-State Circuits - Investigation on Hot-Carrier-Induced degradation of LDMOS transistor fabricated in logic CMOS process
Author:
Huixiong Zheng, ; Huaqiang Wu, ; Bin Wang,
Year: 2014
First_page: 1
Last_page: 2
Isbn: 978-1-4799-2334-2
Md5: 8359a28530ef092b7758c59cf3c9a144
Filesize: 529526
Timeadded: 2015-04-11 10:06:08
Journalid: conf
Original Link: https://www.wenrao.com/i/7FZKLeSWGe9McNaUVzN2n7aveWZzn9JKF
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